Binomial Distribution Calculator
Reviewed by CalcMulti Editorial Team·Last updated: ·← Statistics Hub
The binomial distribution models the number of successes in n independent trials, each with the same probability of success p. It is the foundation of A/B testing, quality control sampling, clinical trial analysis, and any scenario with exactly two outcomes per trial.
This calculator computes the exact probability P(X=k), cumulative probability P(X≤k), and the complementary P(X>k) for any combination of n, k, and p. It also shows the full distribution table and key statistics: mean, variance, and standard deviation.
Formula
P(X = k) = C(n, k) × p^k × (1 − p)^(n−k)
- n
- number of independent trials
- k
- number of successes (0 ≤ k ≤ n)
- p
- probability of success on a single trial (0 < p < 1)
- C(n,k)
- binomial coefficient — n! / (k! × (n−k)!)
Integer 1–1000
Integer 0 to n
Enter as percentage
Binomial vs Poisson vs Normal Approximation — Which to Use?
| Scenario | Use | Conditions | Why |
|---|---|---|---|
| Fixed n trials, known p, counting successes | Binomial (exact) | Any n, any p — always valid | Exact model for the problem |
| Very large n (>1000), small p (<0.05), np < 10 | Poisson (λ=np) | n→∞, p→0, np finite | Computationally simpler, essentially exact |
| Large n, np ≥ 5 and n(1−p) ≥ 5 | Normal approx | n×p ≥ 5 and n×(1−p) ≥ 5 | Central limit theorem applies |
| Small n (< 20) or p near 0 or 1 | Binomial (exact) | Skewed distribution | Normal approx fails at extremes |
| No upper bound on count, counting in interval | Poisson | Continuous interval, rare events | Binomial requires fixed n |
| Proportion CI or z-test for conversion rate | Normal (CLT) | n large, p not extreme | Allows use of z-table / confidence intervals |
Case Study: Semiconductor Quality Control
A chip fabrication engineer samples 50 chips from each production batch. The known defect rate is p=4% per chip. She needs to know: what is the probability of finding more than 5 defective chips in a sample of 50, so she can set a reject threshold without over-triggering false alarms?
Using n=50, p=0.04: mean = 2.0, SD ≈ 1.39. P(X=5) ≈ 0.0295 (2.95%). P(X≤5) ≈ 0.9806. P(X≥6) ≈ 0.0194 (1.94%). This means a batch with normal 4% defect rate will trip the "≥6 defects" alarm only 1.94% of the time — acceptable false alarm rate.
The engineer sets the reject threshold at ≥6 defects (P≈2% false alarm) rather than ≥5 (P≈10%), reducing unnecessary batch holds by 80% while still catching batches with genuinely elevated defect rates. Exact binomial calculation was critical — the normal approximation (np=2, n(1−p)=48 → np < 5) would have been unreliable at this low defect rate.
Related Calculators
Rare events over a fixed interval
Normal Distribution CalculatorNormal approximation to binomial
Chi-Square CalculatorGoodness-of-fit for categorical data
Sample Size CalculatorHow many trials needed
P-Value CalculatorSignificance from test statistic
Z-Score CalculatorNormal approximation z-score
Geometric Distribution CalculatorTrials until first success — related discrete distribution
Binomial vs Normal DistributionWhen the normal approximation to binomial applies
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Disclaimer
This calculator is for educational purposes only and does not constitute professional advice. Results are based on standard mathematical formulas. Always verify critical calculations with a qualified professional before making important decisions.